Agenda for the IOP webinar, 26 May 2020
3:00 - 3:30 pm
Speaker: Dr Konstantin Pavlov
University of Canterbury, Christchurch, New Zealand
Title: Intrinsic X-ray speckle-based imaging: how you can track the speckle’s motion and obtain dark-field signal without explicit tracking.
Abstract: X-ray phase contrast imaging (XPCI) provides an enormous improvement in image contrast between materials having similar absorption but different refraction characteristics. This allows one to resolve features unresolvable by traditional absorption-based X-ray imaging techniques. However, the solution of the appropriate inverse problems (phase retrieval) is still a challenging task.
In this talk I will be sharing with you a few interesting results in X-ray speckle-based imaging and tomography we obtained recently. In particular, you will be learning about:
a) single shot X-ray implicit speckle-tracking imaging
b) multimodal intrinsic speckle tracking
1. K. M. Pavlov, Heyang (Thomas) Li, D. M. Paganin, S. Berujon, H. Rouge-Labriet, E. Brun. Single-shot x-ray speckle-based imaging of a single-material object. Phys. Rev. Appl. 13, 054023 (2020) (see also arXiv:1908.00411).
2. K. M. Pavlov, D. M. Paganin, Heyang (Thomas) Li, S. Berujon, H. Rouge-Labriet and E. Brun. X-ray Multimodal Intrinsic-Speckle-Tracking. arXiv:1911.06814
3:30 - 4:00 pm
Speaker: Martin de Jonge
Nanoprobe Lead Scientist, Australian Synchrotron
Title: A Nanoprobe beamline at the Australian Synchrotron
Abstract: The stage-two buildout of the Australian Synchrotron – known as the BRIGHT project – is the result of an investment agreement with over 30 industrial, research, and academic institutions around Australia and New Zealand. BRIGHT capitalises around $100M+ in contributed funds, and will grow research and characterisation capabilities for funding partners and the user community as a whole. In this presentation we will outline one of the BRIGHT beamlines: the Nanoprobe.
The Nanoprobe targets resolution down to 60 nm for exacting measurements, and routine acquisition in the 100 – 150 nm range. Although optimised for scanning x-ray fluorescence, a host of complementary measurement modalities will be supported. The energy of the focussed beam will be tuneable between around 5 keV and 17 keV, in either high flux mode (reduced energy resolution) or high energy resolution mode. An experimental table will support experiments not requiring the Nanoprobe’s focussing and scanning instrumentation.
In this presentation we will outline the anticipated beamline use-case, and will discuss key design principles with a view to understanding the instrument. We certainly welcome feedback and enquiry, either during / following the presentation or after the event at: email@example.com.
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Meeting ID: 943 2438 6429